About the Micrograph Center

This collection is possible because of broad-based involvement by members of ASM International who participate in the contribution and review of micrographs and supporting data. The collection is a dynamic database that will continuously expand to meet the changing needs of current and future ASM members. The ASM Micrograph Center was developed in 2003 and 2004 under the guidance of an ASM editorial advisory committee with input from other interested member groups including the International Metallographic Society (IMS), the ASM Materials Properties Database Committee, and the ASM Technical Books Committee.

2003�2004 Micrograph Center Editorial Advisory Committee (EAC)

Eugen Abramovici, Bombardier Aerospace
Chris Bagnall, FASM, MCS Assoc.
Rod Boyer, FASM, Boeing
Bruce Bramfitt, FASM, International Steel Group
Sunniva Collins, Swagelok
Patrick Foster, LECO Corp.
Stephen Glancy, Struers
Barry Hindin, Battelle Memorial Institute
Frauke Hogue, Hogue Metallography

Guiru Nash, Electro Motive Div GM
Charles Parker, FASM, Honeywell
Paul Sikorsky, Trane
John Smugeresky, FASM, Sandia
Ray Thompson, Vista Eng
George Vander Voort, FASM, Buehler
Hasso Weiland, Alcoa Inc.

As the Micrograph Center grows, major contributors and those who help with technical review will be recognized here. Content and new acquisitions are managed by the ASM Center for Materials Data staff (Fran Cverna and Theresa Nelson) working closely with volunteer contributors and reviewers.
Want to publish your micrographs or participate in review? Learn how to contribute.

This product was developed by the ASM staff Online Publishing Team: Leslie Chom, Fran Cverna, Sally Fahrenholz-Mann, Scott Henry, Sue Hess, Theresa Nelson, Bonnie Sanders.
Production support by: Sue Cheek, Kathy Dragolich, Jill Kinson
Software production by: Lee Mallabone, Granta Design.

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